Ultra-high Resolution Scanning Electron Microscope SU8200 (UHR CFE-SEM Hitachi SU8220) Field Emission Scanning Electron Microscope+Energy Dispersive X-ray Spectrometer QUANTAX Annular XFlash® QUAD FQ5060 (can do Spectrum Quantification、Objection Quantification , Line Scan、 Light element detection and Mapping in low KV)
Ion Milling System IM4000Plus, Hybrid model : Two milling configurations available
Cross-section milling : smooth polishing of cross-section specimens for high resolution imaging of subsurface structures.
Hitachi H-7100 Transmission Electron Microscope with, CCD Camera
Philips/FEI Tecnai 20 G2 S-Twin Transmission Electron* Microscope(200KV) including EDX Spectroscopy, CCD Camera with Diffpack program (for Diffraction Pattern Analysis)
Hitachi S-4800 Field Emission Scanning Electron Microscope+Energy Dispersive X-ray Spectrometer QUANTAX Annular XFlash® QUAD FQ5060 (can do Spectrum Quantification、Objection Quantification , Line Scan、 Light element detection and Mapping in low KV)
Hitachi Tabletop TM-3000 Scanning Electron Microscope
Hitachi HCP-2 Critical Point Dryer(CDP)
Hitachi E101 Ion Sputter
Quorum Q150R S (Pt)
VD MSP-1S Magnetron (Au) |
