Field Emission Electron Probe Microanalyzer, JEOL JXA-8530F Plus
ULVAC VPS-020 Quick Coater
快速鍍碳機
Scanning Electron Microscopy and X-Ray Microanalysis, J. I. Goldstein et al. Practical Techniques for Microprobe Analysis, JEOL
材料電子顯微鏡學,陳力俊等著,國科會精儀中心,1990