EM000200、EM0002、EM000100、EM0001

新進服務儀器：

X光能量分散光譜儀 (QUANTAX Annular XFlash® QUAD FQ5060)

【EM000107】超高解析冷槍場放射型掃描式電子顯微鏡(UHR CFE-SEM Hitachi SU8220)

【EM000108】超高解析掃描式電顯穿透影像設備(Hitachi SU8220 STEM- TE detecting device)

【EM000109】離子切割研磨機(Hitachi IM4000PLUS)含空氣阻斷系統 (Ion Milling with Cooling control unit and Air Protection System)

Ultra-high Resolution Scanning Electron Microscope SU8200 (UHR CFE-SEM Hitachi SU8220)  Field Emission Scanning Electron Microscope+Energy Dispersive X-ray Spectrometer QUANTAX Annular XFlash® QUAD FQ5060 (can do Spectrum Quantification、Objection Quantification , Line Scan、 Light element detection and Mapping in low KV)

Ion Milling System IM4000Plus, Hybrid model : Two milling configurations available

Cross-section milling : smooth polishing of cross-section specimens for high resolution imaging of subsurface structures.

Hitachi H-7100 Transmission Electron Microscope with, CCD Camera

Philips/FEI Tecnai 20 G2 S-Twin Transmission Electron* Microscope(200KV) including EDX Spectroscopy, CCD Camera with Diffpack program (for Diffraction Pattern Analysis)

Philips/FEI Tecnai G2 Spirit Twin Transmission Electron Mircroscope (120KV) including Cryo-TEM system (with VITRBOT TM Mark IV) and 3-D cryo –EM by tomography analysis (FEI amira®5) 照片

Hitachi S-4800 Field Emission Scanning Electron Microscope+Energy Dispersive X-ray Spectrometer QUANTAX Annular XFlash® QUAD FQ5060 (can do Spectrum Quantification、Objection Quantification , Line Scan、 Light element detection and Mapping in low KV)

Hitachi Tabletop TM-3000 Scanning Electron Microscope

Hitachi HCP-2 Critical Point Dryer(CDP)

Hitachi E101 Ion Sputter

Quorum Q150R S (Pt)

VD MSP-1S Magnetron (Au)